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STRUCTURAL TRANSITION IN ORGANIC THIN FILMS FOR NANOMETER SCALE DATA RECORDING
- Source :
- Acta Physica Sinica. 50:990
- Publication Year :
- 2001
- Publisher :
- Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, 2001.
-
Abstract
- Nanometer scale data recording has been achieved on p-nitrobenzonitrile thin films using scanning tunneling microscopy.When a series of voltage pulse is applied between the STM tip and the highly ordered pyrolytic graphite substrate, structural transition at molecular scale has been observed directly for PNBN thin films.The recording mechanism is attributed to local structural transition at molecular scale,i.e.,from a crystalline state to a disordered one.The former corresponds to a high electrical resistance,and the latter to a low resistance.
- Subjects :
- Materials science
business.industry
General Physics and Astronomy
Nanotechnology
Spin polarized scanning tunneling microscopy
Substrate (electronics)
law.invention
Nanolithography
Electrical resistance and conductance
law
Optoelectronics
Nanometre
Pyrolytic carbon
Scanning tunneling microscope
Thin film
business
Subjects
Details
- ISSN :
- 10003290
- Volume :
- 50
- Database :
- OpenAIRE
- Journal :
- Acta Physica Sinica
- Accession number :
- edsair.doi...........8c508f252b7c773b7bec0dd935a80496
- Full Text :
- https://doi.org/10.7498/aps.50.990