Cite

Multilayers deposited by triode sputtering using a new accurate method of film thicknesses monitoring

MLA

C. Sella, and Tran-Khanh-Vien. “Multilayers Deposited by Triode Sputtering Using a New Accurate Method of Film Thicknesses Monitoring.” Thin Solid Films, vol. 125, Mar. 1985, pp. 367–72. EBSCOhost, https://doi.org/10.1016/0040-6090(85)90246-9.



APA

C. Sella, & Tran-Khanh-Vien. (1985). Multilayers deposited by triode sputtering using a new accurate method of film thicknesses monitoring. Thin Solid Films, 125, 367–372. https://doi.org/10.1016/0040-6090(85)90246-9



Chicago

C. Sella, and Tran-Khanh-Vien. 1985. “Multilayers Deposited by Triode Sputtering Using a New Accurate Method of Film Thicknesses Monitoring.” Thin Solid Films 125 (March): 367–72. doi:10.1016/0040-6090(85)90246-9.