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Noncontact Atomic Force Microscopy. Structures and Electrical Properties of Organic Molecular Films Investigated by Non-contact Atomic Force Microscopy

Authors :
Hirofumi Yamada
Source :
Hyomen Kagaku. 23:166-177
Publication Year :
2002
Publisher :
Surface Science Society Japan, 2002.

Subjects

Subjects :
Kelvin probe force microscope
Materials science
business.industry
Molecular film
Atomic force acoustic microscopy
Optoelectronics
Scanning capacitance microscopy
Conductive atomic force microscopy
Nanoindentation
business
Non-contact atomic force microscopy
Photoconductive atomic force microscopy

Details

ISSN :
18814743 and 03885321
Volume :
23
Database :
OpenAIRE
Journal :
Hyomen Kagaku
Accession number :
edsair.doi...........8df3c58de3d18c5637e5e4c69d41ebd5
Full Text :
https://doi.org/10.1380/jsssj.23.166
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