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A Yoffe-type moving crack in one-dimensional hexagonal piezoelectric quasicrystals
- Source :
- Applied Mathematical Modelling. 65:148-163
- Publication Year :
- 2019
- Publisher :
- Elsevier BV, 2019.
-
Abstract
- A Yoffe-type moving crack in one-dimensional hexagonal piezoelectric quasicrystals is considered. The Fourier transform technique is used to solve a moving crack problem under the action of antiplane shear and inplane electric field. Full elastic stresses of phonon and phason fields and electric fields are derived for a crack running with constant speed in the periodic plane. Obtained results show that the coupled elastic fields inside piezoelectric quasicrystals depend on the speed of crack propagation, and exhibit the usual square-root singularity at the moving crack tip. Electric field and phason stresses do not have singularity and electric displacement and phonon stresses have the inverse square-root singularity at the crack tip for a permeable crack. The field intensity factors and energy release rates are obtained in closed form. The crack velocity does not affect the field intensity factors, but alters the dynamic energy release rate. Bifurcation angle of a moving crack in a 1D hexagonal piezoelectric quasicrystal is evaluated from the viewpoint of energy balance. Obtained results are helpful to better understanding crack advance in piezoelectric quasicrystals.
- Subjects :
- Materials science
Applied Mathematics
Fracture mechanics
02 engineering and technology
Mechanics
Moving crack
Physics::Classical Physics
Antiplane shear
01 natural sciences
Piezoelectricity
Physics::Geophysics
Condensed Matter::Materials Science
020303 mechanical engineering & transports
Singularity
0203 mechanical engineering
Modeling and Simulation
Electric field
0103 physical sciences
Phason
010301 acoustics
Electric displacement field
Subjects
Details
- ISSN :
- 0307904X
- Volume :
- 65
- Database :
- OpenAIRE
- Journal :
- Applied Mathematical Modelling
- Accession number :
- edsair.doi...........8e898c68e062c08126ba29800d4b8441
- Full Text :
- https://doi.org/10.1016/j.apm.2018.08.005