Electronic conduction mechanism and defect chemical model of LaNi0.4Fe0.6O3−

MLA

Shinichi Hashimoto, et al. “Electronic Conduction Mechanism and Defect Chemical Model of LaNi0.4Fe0.6O3−.” Solid State Ionics, vol. 310, Nov. 2017, pp. 148–53. EBSCOhost, https://doi.org/10.1016/j.ssi.2017.08.014.

APA

Shinichi Hashimoto, R. A. Budiman, Takashi Nakamura, Keiji Yashiro, T. Kawada, Koji Amezawa, H. J. Hong, & K. Yamaji. (2017). Electronic conduction mechanism and defect chemical model of LaNi0.4Fe0.6O3−. Solid State Ionics, 310, 148–153. https://doi.org/10.1016/j.ssi.2017.08.014

Chicago

Shinichi Hashimoto, R. A. Budiman, Takashi Nakamura, Keiji Yashiro, T. Kawada, Koji Amezawa, H. J. Hong, and K. Yamaji. 2017. “Electronic Conduction Mechanism and Defect Chemical Model of LaNi0.4Fe0.6O3−.” Solid State Ionics 310 (November): 148–53. doi:10.1016/j.ssi.2017.08.014.