Cite
Ellipsometry and x-ray reflectometry characterization of self-assembly process of polystyrenesulfonate and polyallylamine
MLA
Y. Lvov, et al. “Ellipsometry and X-Ray Reflectometry Characterization of Self-Assembly Process of Polystyrenesulfonate and Polyallylamine.” Colloid & Polymer Science, vol. 272, Oct. 1994, pp. 1317–21. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........8f792960ea6252a8cef3e0d21b73ea4e&authtype=sso&custid=ns315887.
APA
Y. Lvov, A. Tronin, & Claudio Nicolini. (1994). Ellipsometry and x-ray reflectometry characterization of self-assembly process of polystyrenesulfonate and polyallylamine. Colloid & Polymer Science, 272, 1317–1321.
Chicago
Y. Lvov, A. Tronin, and Claudio Nicolini. 1994. “Ellipsometry and X-Ray Reflectometry Characterization of Self-Assembly Process of Polystyrenesulfonate and Polyallylamine.” Colloid & Polymer Science 272 (October): 1317–21. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........8f792960ea6252a8cef3e0d21b73ea4e&authtype=sso&custid=ns315887.