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Adsorption of SiH4 on copper () and () surfaces
- Source :
- Surface Science. 505:308-324
- Publication Year :
- 2002
- Publisher :
- Elsevier BV, 2002.
-
Abstract
- The adsorption of silane on Cu(1 1 1) and Cu(1 1 0) is examined using vibrational electron energy loss spectroscopy, angle-resolved ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy. At room temperature, SiH adsorbs on Cu(1 1 1), whereas complete dissociation occurs on Cu(1 1 0) to leave adsorbed silicon. Below room temperature, an SiHx (x=2 or 3) species exists on both surfaces. A surface-molecule bonding model is constructed to describe the adsorbate–substrate interactions and suggests that both Si and SiH adsorb in a substitutional or hollow site on the (1 1 1) surface and Si adsorbs in one of the same two sites on the (1 1 0) surface.
- Subjects :
- Silanes
Electron energy loss spectroscopy
Analytical chemistry
Surfaces and Interfaces
Condensed Matter Physics
Silane
Dissociation (chemistry)
Surfaces, Coatings and Films
chemistry.chemical_compound
Adsorption
X-ray photoelectron spectroscopy
chemistry
Chemisorption
Materials Chemistry
Ultraviolet photoelectron spectroscopy
Subjects
Details
- ISSN :
- 00396028
- Volume :
- 505
- Database :
- OpenAIRE
- Journal :
- Surface Science
- Accession number :
- edsair.doi...........911ce6edaef95679f9fa1206396a2fb6
- Full Text :
- https://doi.org/10.1016/s0039-6028(02)01378-x