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Numerical modeling of warpage induced in QFN array molding process
- Source :
- Microelectronics Reliability. 47:310-318
- Publication Year :
- 2007
- Publisher :
- Elsevier BV, 2007.
-
Abstract
- Warpage is a critical issue for QFN array molding process. In this paper, a cure-dependent viscoelastic constitutive model is established to model the cure-induced warpage in array molding process. For the relaxation modulus functions of the packaging polymer, the equilibrium moduli are modeled with a model based on scaling analysis and the relaxation behavior of the transient part is described by the cure-dependent relaxation amplitude and reduced relaxation times which are based on the time-conversion superposition principle. The cure-dependent parameters are characterized by using an integrated approach of dynamical mechanical analysis (DMA) and differential scanning calorimetry (DSC) measurements. Finite element modeling is carried out for three configurations of a carrier package map mould and the warpage induced during the curing process and cooling down is predicted. The results show that warpage induced during the curing process has significant contribution on the total warpage of the map.
- Subjects :
- Engineering
business.industry
Numerical analysis
Relaxation (NMR)
Constitutive equation
Electronic packaging
Mechanical engineering
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Finite element method
Viscoelasticity
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Superposition principle
Quad Flat No-leads package
Electrical and Electronic Engineering
Composite material
Safety, Risk, Reliability and Quality
business
Subjects
Details
- ISSN :
- 00262714
- Volume :
- 47
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi...........925c8852565d82c1d10105da4105689b
- Full Text :
- https://doi.org/10.1016/j.microrel.2006.09.036