Methodology of automation process of wafer tests

MLA

Piotr Maj, et al. “Methodology of Automation Process of Wafer Tests.” 2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES), June 2015. EBSCOhost, https://doi.org/10.1109/mixdes.2015.7208579.

APA

Piotr Maj, Robert Szczygiel, Pawel Grybos, Anna Koziol, & A. Krzyżanowska. (2015). Methodology of automation process of wafer tests. 2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES). https://doi.org/10.1109/mixdes.2015.7208579

Chicago

Piotr Maj, Robert Szczygiel, Pawel Grybos, Anna Koziol, and A. Krzyżanowska. 2015. “Methodology of Automation Process of Wafer Tests.” 2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES), June. doi:10.1109/mixdes.2015.7208579.