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Methods for CCD camera characterization

Authors :
Lucas J. van Vliet
G. van der Feltz
Frank R. Boddeke
Hans Netten
James C. Mullikin
Ian T. Young
Source :
SPIE Proceedings.
Publication Year :
1994
Publisher :
SPIE, 1994.

Abstract

In this paper we present methods for characterizing CCD cameras. Interesting properties are linearity of photometric response, signal-to-noise ratio, sensitivity, dark current, and spatial frequency response. The techniques to characterize CCD cameras are carefully designed to assist one in selecting a camera to solve a certain problem. The methods described were applied to a variety of cameras: an Astromed TE3/A with P86000 chip, a Photometrics CC200 series with Thompson chip TH7882, a Photometrics CC200 series with Kodak chip KAF1400, a Xillix' Micro Imager 1400 with Kodak chip KAF1400, an HCS MXR CCD with a Philips chip and a Sony XC-77RRCE.

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
SPIE Proceedings
Accession number :
edsair.doi...........941d67cf15168db3d4b5dad8a00dd2f1
Full Text :
https://doi.org/10.1117/12.175165