Comparison of Characterization Techniques and the Effect of Surface Condition in Poled Silica

Authors :: A. L. C. Triques
G. A. Quintero
Yves Quiquempois
Paula M. P. Gouvêa
Isabel C. S. Carvalho
B. Lesche
H. R. Carvalho
Alexandre Kudlinski
Walter Margulis
Hassina Zeghlache
Niklas Myrén
Gilbert Martinelli
Danays Morejón González
C. S. Franco
Source :: Bragg Gratings, Photosensitivity, and Poling in Glass Waveguides.
Publication Year :: 2003
Publisher :: OSA, 2003.
Abstract: Four characterization techniques are compared in the measurement of the depletion region of silica poled during different time intervals. The effect of pre-etching the samples prior to poling is also investigated.

Subjects :: Surface (mathematics)
Materials science
Atomic force microscopy
business.industry
Poling
Nonlinear optics
Characterization (materials science)
law.invention
Optics
Depletion region
Optical microscope
law
Electric field
Optoelectronics
business

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