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Physical Mechanism for Different Phases and Turn-Around of Idsat in PMOS under HCI Stress
- Source :
- 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
- Publication Year :
- 2021
- Publisher :
- IEEE, 2021.
Details
- Database :
- OpenAIRE
- Journal :
- 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Accession number :
- edsair.doi...........97e9a79abd4d36b154b6d6d6f8c0e0c0