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Element-specific depth profile of magnetism and stoichiometry at theLa0.67Sr0.33MnO3/BiFeO3interface

Authors :
Vinayaka Nagarajan
Ronald Maran
Joel Bertinshaw
Miryam Arredondo
P. Audehm
Eberhard Goering
Clemens Ulrich
David L Cortie
Wayne D. Hutchison
S. Brück
Yu. N. Khaydukov
Olaf Soltwedel
Frank Klose
Quentin M. Ramasse
D. Lott
Thomas Keller
Helmut Fritzsche
Source :
Physical Review B. 90
Publication Year :
2014
Publisher :
American Physical Society (APS), 2014.

Abstract

Depth-sensitive magnetic, structural, and chemical characterization is important in the understanding and optimization of physical phenomena emerging at the interfaces of transition metal oxide heterostructures. In a simultaneous approach we have used polarized neutron and resonant x-ray reflectometry to determine the magnetic profile across atomically sharp interfaces of ferromagnetic ${\mathrm{La}}_{0.67}{\mathrm{Sr}}_{0.33}{\mathrm{MnO}}_{3}$/multiferroic ${\mathrm{BiFeO}}_{3}$ bilayers with subnanometer resolution. In particular, the x-ray resonant magnetic reflectivity measurements at the Fe and Mn resonance edges allowed us to determine the element-specific depth profile of the ferromagnetic moments in both the ${\mathrm{La}}_{0.67}{\mathrm{Sr}}_{0.33}{\mathrm{MnO}}_{3}$ and ${\mathrm{BiFeO}}_{3}$ layers. Our measurements indicate a magnetically diluted interface layer within the ${\mathrm{La}}_{0.67}{\mathrm{Sr}}_{0.33}{\mathrm{MnO}}_{3}$ layer, in contrast to previous observations on inversely deposited layers [P. Yu et al., Phys. Rev. Lett. 105, 027201 (2010)]. Additional resonant x-ray reflection measurements indicate a region of altered Mn and O content at the interface, with a thickness matching that of the magnetic diluted layer, as the origin of the reduction of the magnetic moment.

Details

ISSN :
1550235X and 10980121
Volume :
90
Database :
OpenAIRE
Journal :
Physical Review B
Accession number :
edsair.doi...........983771714cb202ae91f8ada300549eb2
Full Text :
https://doi.org/10.1103/physrevb.90.041113