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A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses
- Source :
- AIP Conference Proceedings.
- Publication Year :
- 2016
- Publisher :
- Author(s), 2016.
-
Abstract
- We present a concept of a dedicated illumination to perform full-field X-ray microscopy with multilayer Laue lenses at laboratory X-ray sources. The basic idea is the application of a focusing X-ray multilayer mirror as condenser optics to provide a quasi-monochromatic and solid illumination, and consequently optimal conditions for the operation of the multilayer Laue lenses. First experimental results demonstrate the proof of this concept.
Details
- ISSN :
- 0094243X
- Database :
- OpenAIRE
- Journal :
- AIP Conference Proceedings
- Accession number :
- edsair.doi...........984d9d65cdccdbd30885671df4b8be94
- Full Text :
- https://doi.org/10.1063/1.4961130