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In situ X-ray diffraction study of lateral and vertical structures of InAs/GaAs(001) quantum dots

Authors :
Masamitu Takahasi
Source :
Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials.
Publication Year :
2009
Publisher :
The Japan Society of Applied Physics, 2009.

Subjects

Subjects :
In situ
Materials science
Quantum dot
business.industry
X-ray crystallography
Optoelectronics
Nanotechnology
business

Details

Database :
OpenAIRE
Journal :
Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials
Accession number :
edsair.doi...........98912231a588ea7cd6b266c90a4f287b
Full Text :
https://doi.org/10.7567/ssdm.2009.p-8-10
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