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A 32-KB ePCM for Real-Time Data Processing in Automotive and Smart Power Applications
- Source :
- IEEE Journal of Solid-State Circuits. 53:2114-2125
- Publication Year :
- 2018
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2018.
-
Abstract
- In the frame of power electronics applications, the request for smart and reconfigurable devices is pushing integration technologies in the direction of embedded systems. In this scenario, microcontrollers play a key role, and the availability of embedded non-volatile memory (eNVM) to store the microcontroller code has become crucial to enable real-time customization and increase system flexibility. Among emerging NVMs, phase change technology is becoming a very attractive solution for the development of applications for smart power and automotive markets. In this paper, a 32-KB embedded phase change memory (ePCM) designed and manufactured in 0.11- $\mu \text{m}$ smart power BCD technology with a specifically optimized Ge-rich Ge-Sb-Te (GST) alloy (supply voltage = 1.8 V) is presented. Thanks to the use of a differential sensing scheme, the proposed ePCM features 18-ns random access time with improved robustness against resistance drift. The word modify time under 32-cell programming parallelism was kept as low as 20 $\mu \text{s}$ , thanks to enhanced programming circuits. The size of the 32-KB eNVM is about 0.7 mm2.
- Subjects :
- 010302 applied physics
business.industry
Computer science
020208 electrical & electronic engineering
Alloy
Automotive industry
02 engineering and technology
engineering.material
01 natural sciences
Non-volatile memory
Phase-change memory
Microcontroller
Smart power
Robustness (computer science)
Embedded system
Power electronics
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
engineering
Electrical and Electronic Engineering
business
Random access
Electronic circuit
Voltage
Subjects
Details
- ISSN :
- 1558173X and 00189200
- Volume :
- 53
- Database :
- OpenAIRE
- Journal :
- IEEE Journal of Solid-State Circuits
- Accession number :
- edsair.doi...........99b296bf7a04bf2978e2dd30b4c1dcbd
- Full Text :
- https://doi.org/10.1109/jssc.2018.2828805