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A 32-KB ePCM for Real-Time Data Processing in Automotive and Smart Power Applications

Authors :
Laura Capecchi
Marco Pasotti
Guido Torelli
L. Croce
Alessandro Cabrini
Riccardo Zurla
Marcella Carissimi
Daniele Gallinari
Emanuela Calvetti
C. Auricchio
Donatella Brambilla
Vikas Rana
Cristina Mazzaglia
Source :
IEEE Journal of Solid-State Circuits. 53:2114-2125
Publication Year :
2018
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2018.

Abstract

In the frame of power electronics applications, the request for smart and reconfigurable devices is pushing integration technologies in the direction of embedded systems. In this scenario, microcontrollers play a key role, and the availability of embedded non-volatile memory (eNVM) to store the microcontroller code has become crucial to enable real-time customization and increase system flexibility. Among emerging NVMs, phase change technology is becoming a very attractive solution for the development of applications for smart power and automotive markets. In this paper, a 32-KB embedded phase change memory (ePCM) designed and manufactured in 0.11- $\mu \text{m}$ smart power BCD technology with a specifically optimized Ge-rich Ge-Sb-Te (GST) alloy (supply voltage = 1.8 V) is presented. Thanks to the use of a differential sensing scheme, the proposed ePCM features 18-ns random access time with improved robustness against resistance drift. The word modify time under 32-cell programming parallelism was kept as low as 20 $\mu \text{s}$ , thanks to enhanced programming circuits. The size of the 32-KB eNVM is about 0.7 mm2.

Details

ISSN :
1558173X and 00189200
Volume :
53
Database :
OpenAIRE
Journal :
IEEE Journal of Solid-State Circuits
Accession number :
edsair.doi...........99b296bf7a04bf2978e2dd30b4c1dcbd
Full Text :
https://doi.org/10.1109/jssc.2018.2828805