Annealing temperature effects on Bi6Fe2Ti3O18/LaNiO3/Si thin films by an all-solution approach

An all-solution approach is successfully used to deposit Bi6Fe2Ti3O18 (BFTO18) thin films onto solution-derived LaNiO3/Si substrates. The effects of annealing temperature on the dielectric, leakage, ferroelectric and magnetic properties are investigated. The mechanisms about the annealing dependence of dielectric, leakage and ferroelectric properties are discussed in detail. Room-temperature weak ferromagnetism is observed for all the derived thin films. The results will provide an effective route to prepare BFTO18 multiferroic thin films with large area by low-cost solution method.