X-ray Phase Imaging by Two-Beam Interferometry with Full-Field X-ray Microscope and Transmission Grating

Authors :: Atsushi Momose
Yasuko Terada
Masato Hoshino
Karol Vegso
Yanlin Wu
Hidekazu Takano
Source :: Microscopy and Microanalysis. 24:220-221
Publication Year :: 2018
Publisher :: Oxford University Press (OUP), 2018.

Subjects :: Materials science
business.industry
X-ray
02 engineering and technology
Full field
021001 nanoscience & nanotechnology
01 natural sciences
Interferometry
Optics
0103 physical sciences
Phase imaging
010306 general physics
0210 nano-technology
business
Instrumentation
Diffraction grating
Beam (structure)
X-ray microscope

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