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Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Authors :
Radim Skoupy
Jana Nebesarova
Vladislav Krzyzanek
Source :
Microscopy and Microanalysis. 22:926-927
Publication Year :
2016
Publisher :
Oxford University Press (OUP), 2016.

Subjects

Subjects :
0301 basic medicine
03 medical and health sciences
030104 developmental biology
Materials science
Cathode ray
Composite material
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
22
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........9ac472a4a3895d003948903fc06fb27d
Full Text :
https://doi.org/10.1017/s143192761600547x
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