ssEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features

MLA

Inwan Yoo, et al. SsEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features. Jan. 2017. EBSCOhost, https://doi.org/10.1007/978-3-319-67558-9_29.

APA

Inwan Yoo, Wei-Chung Allen Lee, David G. C. Hildebrand, Willie F. Tobin, & Won-Ki Jeong. (2017). ssEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features. https://doi.org/10.1007/978-3-319-67558-9_29

Chicago

Inwan Yoo, Wei-Chung Allen Lee, David G. C. Hildebrand, Willie F. Tobin, and Won-Ki Jeong. 2017. “SsEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features,” January. doi:10.1007/978-3-319-67558-9_29.