Focused Ion Beam Enabled Analysis of Nanocomposite and Nanostructured Soft Materials

Authors :: Ji-Hyun Jang
Steven E. Kooi
Chaitanya K. Ullal
Edwin L. Thomas
Source :: Microscopy and Microanalysis. 12:1264-1265
Publication Year :: 2006
Publisher :: Oxford University Press (OUP), 2006.
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Subjects :: Nanocomposite
Materials science
Nanotechnology
Instrumentation
Focused ion beam
Soft materials

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