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Nanometer scale patterning by scanning tunelling microscope assisted chemical vapour deposition

Authors :
D. Tonneau
Vincent Bouchiat
R. Even
H. Dallaporta
V. I. Safarov
R. Pierrisnard
F. Marchi
P. Doppelt
Source :
Microelectronic Engineering. 50:59-65
Publication Year :
2000
Publisher :
Elsevier BV, 2000.

Abstract

Single electron devices are of great interest for their possible replacement of transistors in memories. The key to the preparation of these components is the production of low capacitance dots, which requires a lithography step at nanometric scale. Direct patterning of metallic features at nanometric scale is possible by local decomposition of gaseous molecules under a scanning tunneling microscope (STM) tip, by application of a voltage of a few volts on the sample (STM assisted chemical vapour deposition). The gaseous molecules are dissociated by the high electric field (about 107 V/cm) within the tip–sample gap. Rhodium lines and dots have been deposited on gold or silicon surfaces by decomposition of [Rh(PF3)2Cl]2. The influence of the sample voltage was studied and the resolution limit of the technique was investigated.

Details

ISSN :
01679317
Volume :
50
Database :
OpenAIRE
Journal :
Microelectronic Engineering
Accession number :
edsair.doi...........9c35d9ab56a7924507f687555bd594b0
Full Text :
https://doi.org/10.1016/s0167-9317(99)00265-8