Cite
Preferential sputtering and mass conservation in AES and SIMS depth profiling
MLA
Bing Lin, et al. “Preferential Sputtering and Mass Conservation in AES and SIMS Depth Profiling.” Vacuum, vol. 160, Feb. 2019, pp. 109–13. EBSCOhost, https://doi.org/10.1016/j.vacuum.2018.11.020.
APA
Bing Lin, Jiangyong Wang, Songyou Lian, Xinliang Yan, & Congkang Xu. (2019). Preferential sputtering and mass conservation in AES and SIMS depth profiling. Vacuum, 160, 109–113. https://doi.org/10.1016/j.vacuum.2018.11.020
Chicago
Bing Lin, Jiangyong Wang, Songyou Lian, Xinliang Yan, and Congkang Xu. 2019. “Preferential Sputtering and Mass Conservation in AES and SIMS Depth Profiling.” Vacuum 160 (February): 109–13. doi:10.1016/j.vacuum.2018.11.020.