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Submicrometer ${\rm Nb}/{\rm Al}{-}{\rm AlO}_{\rm x}/{\rm Nb}$ Integrated Circuit Fabrication Process for Quantum Computing Applications

Authors :
Bruce Bumble
G.L. Kerber
A. W. Kleinsasser
Anupama B. Kaul
A. Fung
E. Ladizinsky
Paul I. Bunyk
Source :
IEEE Transactions on Applied Superconductivity. 19:226-229
Publication Year :
2009
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2009.

Abstract

We have developed a low Jc (100-1000 A/cm2) submicrometer Nb integrated circuit fabrication process for SQUID-based quantum computing applications. The baseline process consists of 7 masking steps including Pd-Au resistor, Nb/Al-AlOx/Nb trilayer, two Nb wiring layers and two sputtered SiO2 dielectric layers. We have also fabricated wafers with an Nb ground plane. Using deep-UV lithography, inductively coupled plasma etch tools, and self-aligned lift-off for device definition, we routinely achieve micrometer lines and spaces with 400 nm minimum junction dimensions. Room temperature testing is used to select wafers in process and junction annealing has been calibrated for trimming current density. We will describe the process which has been used to produce circuits with over 100 junctions.

Details

ISSN :
15582515 and 10518223
Volume :
19
Database :
OpenAIRE
Journal :
IEEE Transactions on Applied Superconductivity
Accession number :
edsair.doi...........a12b7fefaa4f4c3629fe70e0777d2963
Full Text :
https://doi.org/10.1109/tasc.2009.2018249