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A method for SiC MOSFETs gate oxide degradation monitoring based on turn-on di/dt delay time
- Source :
- 2022 IEEE Transportation Electrification Conference and Expo, Asia-Pacific (ITEC Asia-Pacific).
- Publication Year :
- 2022
- Publisher :
- IEEE, 2022.
Details
- Database :
- OpenAIRE
- Journal :
- 2022 IEEE Transportation Electrification Conference and Expo, Asia-Pacific (ITEC Asia-Pacific)
- Accession number :
- edsair.doi...........a1426e3e0c3178a884680db6478565a4