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A Simple Panel Unit Root Test by Combining Dependent P-Values

Authors :
Jingyun Yang
Xuguang Simon Sheng
Source :
SSRN Electronic Journal.
Publication Year :
2009
Publisher :
Elsevier BV, 2009.

Abstract

This paper proposes a simple panel unit root test based on Zaykin et al.’s (2002) truncated product method. The test is powerful in cases where there are only a few large p-values, and is robust to a certain degree of cross-section dependence. Monte Carlo evidence shows good size and power properties relative to existing p-value combination tests. Unlike the previous tests, the new test allows to make stronger claims in the event of rejection of the null hypothesis. The proposed test is applied to a panel of 27 OECD real exchange rate series as well as to a group of inflation density forecasts in the SPF data.

Details

ISSN :
15565068
Database :
OpenAIRE
Journal :
SSRN Electronic Journal
Accession number :
edsair.doi...........a189d9fd209d121011dbc7a5f72bf4f6
Full Text :
https://doi.org/10.2139/ssrn.1526047