Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers

MLA

Uppili S. Raghunathan, et al. “Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers.” IEEE Transactions on Electron Devices, vol. 62, May 2015, pp. 1383–89. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........a2d4fcd74c1e1e09e548048d83dd078c&authtype=sso&custid=ns315887.

APA

Uppili S. Raghunathan, Michael A. Oakley, Partha S. Chakraborty, Brian R. Wier, & John D. Cressler. (2015). Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers. IEEE Transactions on Electron Devices, 62, 1383–1389.

Chicago

Uppili S. Raghunathan, Michael A. Oakley, Partha S. Chakraborty, Brian R. Wier, and John D. Cressler. 2015. “Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers.” IEEE Transactions on Electron Devices 62 (May): 1383–89. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........a2d4fcd74c1e1e09e548048d83dd078c&authtype=sso&custid=ns315887.