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A Comprehensive Compact Model for GaN HEMTs, Including Quasi-Steady-State and Transient Trap-Charge Effects
- Source :
- IEEE Transactions on Electron Devices. 63:1478-1485
- Publication Year :
- 2016
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2016.
-
Abstract
- A comprehensive scalable trap-charge model for the dc and pulsed $I$ – $V$ modeling of GaN high electron-mobility transistor is presented. While interface traps are considered for dc $I$ – $V$ modeling, surface states and traps in the AlGaN barrier and GaN buffer are considered for the pulsed $I$ – $V$ model. A surface-potential-based model is presented for interface traps, which is then adapted to the current model for the dc modeling. For the pulsed $I$ – $V$ modeling, a semiempirical approach is proposed for gate lag as well as both gate-lag and drain-lag conditions. The model is able to capture the effects of gate ( $V_{\mathrm{ gq}})$ and drain ( $V_{\mathrm{ dq}})$ quiescent biases as well as the stress time ( $T_{\mathrm{\scriptscriptstyle OFF}})$ , and is validated with both numerical simulation and measurement data. Finally, for the accurate transient simulations in switching applications, the emission of electrons is also modeled in Verilog-A using an asymptotic solution of a differential equation, which can be a better alternative to that of the $RC$ subcircuit approach.
- Subjects :
- 010302 applied physics
Physics
Computer simulation
Differential equation
Transistor
Analytical chemistry
Steady State theory
Charge (physics)
Gallium nitride
02 engineering and technology
Electron
021001 nanoscience & nanotechnology
01 natural sciences
Electronic, Optical and Magnetic Materials
law.invention
chemistry.chemical_compound
chemistry
law
0103 physical sciences
Transient (oscillation)
Electrical and Electronic Engineering
Atomic physics
0210 nano-technology
Subjects
Details
- ISSN :
- 15579646 and 00189383
- Volume :
- 63
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Electron Devices
- Accession number :
- edsair.doi...........a4c70c5a0c96406781c49273ab44d465