Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples

Authors :: Alvin J. Drehman
Anna M. Clark
Pearl Yip
R. Bruni
Leon P. Van Speybroeck
Daniel A. Schwartz
Alan P. Shapiro
Suzanne Romaine
Source :: SPIE Proceedings.
Publication Year :: 1996
Publisher :: SPIE, 1996.
Abstract: One of the specifications used to polish the AXAF witness samples was that the rms surface roughness be

Subjects :: X-ray reflectivity
Optics
Materials science
business.industry
Atomic force microscopy
Surface roughness
Polishing
Spectral density
Angstrom
business
Reflectivity
Metrology

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