Cite
A novel deep-impurity-level assisted tunneling technology for enhanced interband tunneling probability
MLA
Jiaxin Wang, et al. “A Novel Deep-Impurity-Level Assisted Tunneling Technology for Enhanced Interband Tunneling Probability.” 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Oct. 2016. EBSCOhost, https://doi.org/10.1109/icsict.2016.7999004.
APA
Jiaxin Wang, Qianqian Huang, Ru Huang, Rundong Jia, Yang Zhao, & Chunlei Wu. (2016). A novel deep-impurity-level assisted tunneling technology for enhanced interband tunneling probability. 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT). https://doi.org/10.1109/icsict.2016.7999004
Chicago
Jiaxin Wang, Qianqian Huang, Ru Huang, Rundong Jia, Yang Zhao, and Chunlei Wu. 2016. “A Novel Deep-Impurity-Level Assisted Tunneling Technology for Enhanced Interband Tunneling Probability.” 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), October. doi:10.1109/icsict.2016.7999004.