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Review of Pulse Test Setup for the Switching Characterization of GaN Power Devices

Authors :
Guangze Zu
Huiqing Wen
Yinxiao Zhu
Rui Zhong
Qinglei Bu
Wen Liu
Yinchao Zhao
Miao Cui
Source :
IEEE Transactions on Electron Devices. 69:3003-3013
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
15579646 and 00189383
Volume :
69
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........a84b881538dca83ac9757a18587b4454