Cite
Validity Analysis on the Positioning of Superconducting Fault Current Limiter in Neighboring AC and DC Microgrid
MLA
Woo-Ju Shin, et al. “Validity Analysis on the Positioning of Superconducting Fault Current Limiter in Neighboring AC and DC Microgrid.” IEEE Transactions on Applied Superconductivity, vol. 23, June 2013, p. 5600204. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........a96612fdfd66090cd7779765110ab6cc&authtype=sso&custid=ns315887.
APA
Woo-Ju Shin, Umer Amir Khan, Jae-Kyu Seong, Jong-Geon Lee, Bang-Wook Lee, Yong-Han Kim, & Jae-Sang Hwang. (2013). Validity Analysis on the Positioning of Superconducting Fault Current Limiter in Neighboring AC and DC Microgrid. IEEE Transactions on Applied Superconductivity, 23, 5600204.
Chicago
Woo-Ju Shin, Umer Amir Khan, Jae-Kyu Seong, Jong-Geon Lee, Bang-Wook Lee, Yong-Han Kim, and Jae-Sang Hwang. 2013. “Validity Analysis on the Positioning of Superconducting Fault Current Limiter in Neighboring AC and DC Microgrid.” IEEE Transactions on Applied Superconductivity 23 (June): 5600204. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........a96612fdfd66090cd7779765110ab6cc&authtype=sso&custid=ns315887.