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New approaches to defect characterisation with high resolution non-contacting laser ultrasound

Authors :
Matt Clark
Stephen Sharples
Michael Geoffrey Somekh
Source :
IEEE Symposium on Ultrasonics, 2003.
Publication Year :
2004
Publisher :
IEEE, 2004.

Abstract

This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.

Details

Database :
OpenAIRE
Journal :
IEEE Symposium on Ultrasonics, 2003
Accession number :
edsair.doi...........a9ada30142fd6337a4e4dfccc70fadde
Full Text :
https://doi.org/10.1109/ultsym.2003.1293518