Back to Search
Start Over
OS04F033 Microstructural Characterization of Nanocrystalline Nickel Thin Films by X-Ray Diffraction
- Source :
- The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics. :OS04F033
- Publication Year :
- 2011
- Publisher :
- Japan Society of Mechanical Engineers, 2011.
Details
- ISSN :
- 24242837
- Database :
- OpenAIRE
- Journal :
- The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics
- Accession number :
- edsair.doi...........aa4d498919f81b0e96777a502363c80d
- Full Text :
- https://doi.org/10.1299/jsmeatem.2011.10._os04f033-