Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination

MLA

吴世法 Wu Shifa, et al. “Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination.” Acta Optica Sinica, vol. 30, Jan. 2010, pp. 2272–77. EBSCOhost, https://doi.org/10.3788/aos20103008.2272.

APA

吴世法 Wu Shifa, 刘琨 Liu Kun, 王昭 Wang Zhao, & 李宏 Li Hong. (2010). Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination. Acta Optica Sinica, 30, 2272–2277. https://doi.org/10.3788/aos20103008.2272

Chicago

吴世法 Wu Shifa, 刘琨 Liu Kun, 王昭 Wang Zhao, and 李宏 Li Hong. 2010. “Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination.” Acta Optica Sinica 30 (January): 2272–77. doi:10.3788/aos20103008.2272.