Aberration-corrected scanning transmission electron microscopy of semiconductors

MLA

Niklas Dellby, et al. “Aberration-Corrected Scanning Transmission Electron Microscopy of Semiconductors.” Journal of Physics: Conference Series, vol. 326, Nov. 2011, p. 012005. EBSCOhost, https://doi.org/10.1088/1742-6596/326/1/012005.

APA

Niklas Dellby, Ondrej L. Krivanek, & M.F. Murfitt. (2011). Aberration-corrected scanning transmission electron microscopy of semiconductors. Journal of Physics: Conference Series, 326, 012005. https://doi.org/10.1088/1742-6596/326/1/012005

Chicago

Niklas Dellby, Ondrej L. Krivanek, and M.F. Murfitt. 2011. “Aberration-Corrected Scanning Transmission Electron Microscopy of Semiconductors.” Journal of Physics: Conference Series 326 (November): 012005. doi:10.1088/1742-6596/326/1/012005.