The digital twin of the quality monitoring and control in the series solar cell production line

With the development of intelligent manufacturing (IM), the Digital twin (DT) has become an important means to the evolution mechanism of the process. Many researchers pay attention on the realization of DT in different industries. Based on the DT and Digital Twin Shop Floor (DTS) model, a novel, high throughput metrology method is proposed in the process quality monitoring and control of the Series Solar Cell Production Line (SSCPL) for detailed performance analysis. The variance of individual loss parameters and their impact on quality performance are quantified and mapped into the virtual space. The nature of their distributions and correlations provide great insights about quality loss mechanisms in process monitoring, helping to prioritize efforts for optimizing the control of the SSCPL in the physical space. Additionally, the parameters can be tied back to the physical space, allowing the data to be used directly for the control in the manufacturing. The data-loop of “Autonomous perception of process parameters - Dynamic behaver mapping - Online monitoring - Online data analysis - Parameters configuration & control” can be obtained in the model. This paper provides an application paradigm for DT and IM.