Cite
[Untitled]
MLA
Hillel Miller, et al. Journal of Electronic Testing, vol. 16, Jan. 2000, pp. 107–20. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........ac87fbe899e8550d5a16be7963cea7d5&authtype=sso&custid=ns315887.
APA
Hillel Miller, Kurt Shultz, Carl Pixley, Jun Yuan, & Adnan Aziz. (2000). Journal of Electronic Testing, 16, 107–120.
Chicago
Hillel Miller, Kurt Shultz, Carl Pixley, Jun Yuan, and Adnan Aziz. 2000. Journal of Electronic Testing 16 (January): 107–20. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........ac87fbe899e8550d5a16be7963cea7d5&authtype=sso&custid=ns315887.