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Improvement of the electron beam (e-beam) lunar dust mitigation technology with varying the beam incident angle
Improvement of the electron beam (e-beam) lunar dust mitigation technology with varying the beam incident angle
- Source :
- Acta Astronautica. 188:362-366
- Publication Year :
- 2021
- Publisher :
- Elsevier BV, 2021.
-
Abstract
- Dust hazards are considered to be one of the technical challenges for future lunar exploration. In our past work a new dust mitigation technology was introduced utilizing an electron beam to remove dust particles from various surfaces. This technology was developed based on a patched charge model, which shows that the emission and re-absorption of electron beam induced secondary electrons inside microcavities between dust particles can lead to sufficiently large charges on the dust particles, causing their release from the surface due to strong repulsive forces. In this paper an improvement in the effectiveness of this technology is demonstrated with varying the beam incident angle on dust-covered sample surfaces by rotating the samples relative to the beam. Due to random arrangements of the microcavities, more of them will be exposed to the beam with various incident angles, thereby causing more dust release from the surface. The cleaning performance is tested against three samples: glass, spacesuit, and a photovoltaic (PV) panel. Lunar simulant (
- Subjects :
- Materials science
business.industry
Dust particles
Photovoltaic system
Charge model
Aerospace Engineering
Astrophysics::Cosmology and Extragalactic Astrophysics
Secondary electrons
Optics
Cathode ray
Electron beam processing
Astrophysics::Earth and Planetary Astrophysics
business
Astrophysics::Galaxy Astrophysics
Beam (structure)
Subjects
Details
- ISSN :
- 00945765
- Volume :
- 188
- Database :
- OpenAIRE
- Journal :
- Acta Astronautica
- Accession number :
- edsair.doi...........acba320e34c139e235ac64d84ac146f1
- Full Text :
- https://doi.org/10.1016/j.actaastro.2021.07.040