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CNTFET based radiation hardened latch

Authors :
Shazia Shakeel
Naushad Alam
Source :
Australian Journal of Electrical and Electronics Engineering. 18:199-208
Publication Year :
2021
Publisher :
Informa UK Limited, 2021.

Abstract

In this paper, a carbon nanotube field effect transistor (CNTFET) based single event upset (SEU) tolerant latch is proposed. The proposed latch can tolerate the effect of particle strike at any of ...

Subjects

Subjects :
Carbon nanotube fet
Materials science
business.industry
Hardware_PERFORMANCEANDRELIABILITY
Radiation
Carbon nanotube field-effect transistor
Single effect
Hardware_GENERAL
Single event upset
Hardware_INTEGRATEDCIRCUITS
Optoelectronics
Particle
Hardware_ARITHMETICANDLOGICSTRUCTURES
Electrical and Electronic Engineering
business
Hardware_LOGICDESIGN

Details

ISSN :
2205362X and 1448837X
Volume :
18
Database :
OpenAIRE
Journal :
Australian Journal of Electrical and Electronics Engineering
Accession number :
edsair.doi...........ad1b3319adf11e26351c2b188d7d8e03
Full Text :
https://doi.org/10.1080/1448837x.2021.1958978
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