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Secondary ion mass spectrometry to verify the implantation of magnetic ions in nanodiamonds

Authors :
Bo-Rong Lin
Chun-Hsiang Chang
Srinivasu Kunuku
Chien-Hsu Chen
Hung-Kai Yu
Tung-Yuan Hsiao
Li-Chuan Liao
Fang-Hsin Chen
C. P. Lee
Chiung-Chi Wang
Yu-Jen Chang
Tzung-Yuang Chen
Huan Niu
Source :
Journal of Applied Physics. 126:175301
Publication Year :
2019
Publisher :
AIP Publishing, 2019.

Abstract

Ion implantation is used to create nanodiamonds (NDs) with embedded magnetic ions for use in a wide range of biological and medical applications; however, the effectiveness of this process depends heavily on separating magnetic NDs from nonmagnetic ones. In this study, we use secondary ion mass spectrometry to verify the implantation of magnetic ions in NDs and the success of separation. When applied to a series of NDs with embedded iron or manganese ions, the sorting tool used in this study proved highly effective in selecting magnetic NDs. Besides, multienergy ion implantation and precise thickness control of NDs coating on the silicon wafer were suggested to improve this technology.

Details

ISSN :
10897550 and 00218979
Volume :
126
Database :
OpenAIRE
Journal :
Journal of Applied Physics
Accession number :
edsair.doi...........af5f033ea5226f34cfbcf445be1407ab