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Secondary ion mass spectrometry to verify the implantation of magnetic ions in nanodiamonds
- Source :
- Journal of Applied Physics. 126:175301
- Publication Year :
- 2019
- Publisher :
- AIP Publishing, 2019.
-
Abstract
- Ion implantation is used to create nanodiamonds (NDs) with embedded magnetic ions for use in a wide range of biological and medical applications; however, the effectiveness of this process depends heavily on separating magnetic NDs from nonmagnetic ones. In this study, we use secondary ion mass spectrometry to verify the implantation of magnetic ions in NDs and the success of separation. When applied to a series of NDs with embedded iron or manganese ions, the sorting tool used in this study proved highly effective in selecting magnetic NDs. Besides, multienergy ion implantation and precise thickness control of NDs coating on the silicon wafer were suggested to improve this technology.
- Subjects :
- 010302 applied physics
Range (particle radiation)
Materials science
General Physics and Astronomy
Nanoparticle
Nanotechnology
02 engineering and technology
engineering.material
equipment and supplies
021001 nanoscience & nanotechnology
01 natural sciences
Ion
Secondary ion mass spectrometry
Ion implantation
Coating
0103 physical sciences
engineering
Surface modification
Wafer
0210 nano-technology
human activities
Subjects
Details
- ISSN :
- 10897550 and 00218979
- Volume :
- 126
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Physics
- Accession number :
- edsair.doi...........af5f033ea5226f34cfbcf445be1407ab