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Effect of Electrical Contact Resistance in a Silicon Nanowire Thermoelectric Cooler and a Design Guideline for On-Chip Cooling Applications
- Source :
- Journal of Electronic Materials. 42:1476-1481
- Publication Year :
- 2012
- Publisher :
- Springer Science and Business Media LLC, 2012.
-
Abstract
- Contact resistance gains prominence as feature size reduces to the nanometer length scale. This work studies the effects of electrical contact resistance on the performance of silicon nanowire-based thermoelectric coolers using COMSOL Multiphysics. The values of the contact resistance used to simulate the impact are experimentally extracted from a pair of thermoelectric legs with each leg made of top-down-fabricated 100 silicon nanowires having diameter of 100 nm. Analytical models agreeing well with the simulation results are provided. Lastly, a design methodology is proposed for optimum performance in on-chip cooling applications.
- Subjects :
- Length scale
Thermoelectric cooling
Materials science
Solid-state physics
business.industry
Multiphysics
Contact resistance
Condensed Matter Physics
Electrical contacts
Electronic, Optical and Magnetic Materials
Thermoelectric effect
Materials Chemistry
Optoelectronics
Nanometre
Electrical and Electronic Engineering
business
Subjects
Details
- ISSN :
- 1543186X and 03615235
- Volume :
- 42
- Database :
- OpenAIRE
- Journal :
- Journal of Electronic Materials
- Accession number :
- edsair.doi...........af9d2fabf51ae138e8bc93ea6cad9c45