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Current-Voltage Model for Negative Capacitance Field-Effect Transistors

Authors :
Changhwan Shin
Hyunjae Lee
Youngki Yoon
Source :
IEEE Electron Device Letters. 38:669-672
Publication Year :
2017
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2017.

Abstract

In this letter, a semi-analytical current–voltage model for a negative capacitance field-effect transistor (NCFET) with a ferroelectric material ( i.e. , BaTiO3) is proposed. Surface potential ( $\psi _{\mathrm {S}})$ in the channel region is determined first by solving the Landau–Khalatnikov (LK) equation numerically with Poisson’s equation. Then, the drain–current is achieved based on the current continuity equation using $\psi _{\mathrm {S}}$ determined earlier. In addition, by introducing a fitting potential for a given drain–voltage, threshold voltage shift can be captured, resulting in accurate surface potential and drain–current at different gate voltages. We have verified our model using the technology computer-aided design (TCAD)-MATLAB simulation, and our model exhibits an excellent agreement to the simulation results. In addition, the impacts of the ferroelectric thickness and channel doping concentration on the device performance and hysteresis window of NCFET are thoroughly explored.

Details

ISSN :
15580563 and 07413106
Volume :
38
Database :
OpenAIRE
Journal :
IEEE Electron Device Letters
Accession number :
edsair.doi...........afb15170b55b84d25787566eedd4cdc7