Cite
An investigation of FinFET single-event latch-up characteristic and mitigation method
MLA
Zhenyu Wu, et al. “An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method.” Microelectronics Reliability, vol. 114, Nov. 2020, p. 113901. EBSCOhost, https://doi.org/10.1016/j.microrel.2020.113901.
APA
Zhenyu Wu, Dongqing Li, Chang Cai, Peixiong Zhao, Tianqi Liu, Ze He, & Jie Liu. (2020). An investigation of FinFET single-event latch-up characteristic and mitigation method. Microelectronics Reliability, 114, 113901. https://doi.org/10.1016/j.microrel.2020.113901
Chicago
Zhenyu Wu, Dongqing Li, Chang Cai, Peixiong Zhao, Tianqi Liu, Ze He, and Jie Liu. 2020. “An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method.” Microelectronics Reliability 114 (November): 113901. doi:10.1016/j.microrel.2020.113901.