Memristive devices as a potential resistance standard

Authors :: Vitor Cabral
Alessandro Cultrera
Shaochuan Chen
João Pereira
Luís Ribeiro
Isabel Godinho
Luca Boarino
Natascia De Leo
Luca Callegaro
Susana Freitas
Ilia Valov
Gianluca Milano
Source :: Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing.
Publication Year :: 2022
Publisher :: IMEKO, 2022.

Database :: OpenAIRE
Journal :: Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing
Accession number :: edsair.doi...........b358954ea7922844115d3b993fbeed68
Full Text :: https://doi.org/10.21014/tc4-2022.03