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Nanowire Reconstruction on the 4H-SiC(1102) Surface
- Source :
- Materials Science Forum. :529-532
- Publication Year :
- 2007
- Publisher :
- Trans Tech Publications, Ltd., 2007.
-
Abstract
- Ordered reconstruction phases on the 4H-SiC(1102) surface have been investigated using low-energy electron diffraction (LEED), Auger electron spectroscopy (AES) and scanning tunneling microscopy (STM). After initial hydrogen etching, the samples were prepared by Si deposition and annealing in ultra-high vacuum (UHV). Two distinct reconstruction phases develop upon annealing, first with a (2×1), and at higher temperatures with a c(2×2) LEED pattern. After further annealing the fractional order LEED spots vanish and a (1x1) pattern develops. For the (2×1) phase, STM micrographs show that adatom chains develop on large flat terraces, which in view of AES consist of additional Si. These highly linear and equidistant chains represent a self-assembled well-ordered pattern of nanowires developing due to the intrinsic structure of the 4H-SiC(1102) surface. For the c(2×2) phase AES indicates a surface composition close to the bulk stoichiometry. For the (1×1) phase a further Si depletion is observed.
- Subjects :
- Surface (mathematics)
Auger electron spectroscopy
Reflection high-energy electron diffraction
Materials science
Low-energy electron diffraction
Mechanical Engineering
Nanowire
Condensed Matter Physics
law.invention
Electron diffraction
Mechanics of Materials
law
General Materials Science
Scanning tunneling microscope
Atomic physics
Surface reconstruction
Subjects
Details
- ISSN :
- 16629752
- Database :
- OpenAIRE
- Journal :
- Materials Science Forum
- Accession number :
- edsair.doi...........b37adea5a26818b2e74d141c09c22719
- Full Text :
- https://doi.org/10.4028/www.scientific.net/msf.556-557.529