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Characterization of defects in diamond PiN diodes by electron beam induced current
- Source :
- Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.
- Publication Year :
- 2019
- Publisher :
- The Japan Society of Applied Physics, 2019.
Details
- Database :
- OpenAIRE
- Journal :
- Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials
- Accession number :
- edsair.doi...........b5954f7b5846f36ed63b8eb17c5f5aa2
- Full Text :
- https://doi.org/10.7567/ssdm.2019.ps-4-13