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Degradation Behavior and Mechanism of Metalized Film Capacitor Under Ultrahigh Field

Authors :
Lu Cheng
Zhiyuan Li
Jingran Wang
Zhe Xu
Wenfeng Liu
Shengtao Li
Source :
IEEE Transactions on Dielectrics and Electrical Insulation. 30:509-517
Publication Year :
2023
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2023.

Subjects

Subjects :
Electrical and Electronic Engineering

Details

ISSN :
15584135 and 10709878
Volume :
30
Database :
OpenAIRE
Journal :
IEEE Transactions on Dielectrics and Electrical Insulation
Accession number :
edsair.doi...........b683b436fa2762493775f35c2bef3874

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