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Modeling of black phosphorus vertical TFETs without chemical doping for drain

Authors :
Umberto Ravaioli
Shang-Chun Lu
Youngseok Kim
Matthew J. Gilbert
Mohamed Mohamed
Source :
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Publication Year :
2017
Publisher :
IEEE, 2017.

Abstract

A new vertical tunnel FET design based on black phosphorus is presented in this paper adopting asymmetric layer numbers for top and bottom layer with undoped drain. The results show that the SS and I on /I off can be maintained below 10 mV/dec and beyond 105, respectively, when channel length is down to 3 nm.

Details

Database :
OpenAIRE
Journal :
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Accession number :
edsair.doi...........b7132470e8d94d542cef1228d352e8ce
Full Text :
https://doi.org/10.23919/sispad.2017.8085335