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Attenuation measurements in single-crystal sapphire fiber via Raman scattering intensity

Authors :
Daniel S. Homa
Cary Hill
Zhihao Yu
Bo Liu
Yujie Cheng
Anbo Wang
Michael P. Buric
Benjamin Chorpening
Gary Pickrell
Source :
Optical Components and Materials XV.
Publication Year :
2018
Publisher :
SPIE, 2018.

Abstract

Performing attenuation measurements in unclad single crystal sapphire fiber has traditionally been accomplished through use the cutback method. Because single-crystal sapphire fibers do not cleave easily like silica fibers, this method requires repeated cutting and polishing of the sapphire fiber sample; which is very time consuming and introduces uncertainty in each loss measurement. In this paper, we present a new method to measure attenuation in sapphire or other single-crystal fibers based on distributed sapphire Raman optical time domain reflectometry (OTDR). This method is both nondestructive, significantly faster than the cutback method, and capable of measuring the local loss along the entire length of the fiber.

Details

Database :
OpenAIRE
Journal :
Optical Components and Materials XV
Accession number :
edsair.doi...........b7696843492feee5a4129b775c63029c